OU EMPL Instrumental Hardware Configuration
Instrument Type: Cameca
SX50
Electron Optical Column
Specifications
Accelerating Voltages: £ 50 KV
Beam Currents: automatic regulation in the
range 1-1000 nA; manual control to lower currents
Analytical Configuration
1. X-ray take-off geometry: 40°
2. Wavelength dispersive spectrometers: five, asynchronous, configured as
|
Spec.# |
Type* |
Diffraction Devices |
|
1 |
HP |
LiF, PET |
|
2 |
LP |
TAP, PC1 (2d=62.5Å) |
|
3 |
HP |
LiF, PET |
|
4 |
LP |
TAP, PC3 (2d=200Å) or PC2 (2d=95Å) |
|
5 |
LP |
TAP, PET |
* HP: High-pressure (26-33 psi) P10 gas, 6 mm mylar
window at column, Be window at detector
* LP: Low-pressure (2-4 psi)
P10 gas, thin polypropylene windows at column and detector
3. Energy Dispersive X-Ray Detector: PGT PRISM 2000 with Moxtek
entry window for light-element detection, running under SAMx IDFIX PC-based
automation providing complete integration with WDS analytical and digital
imaging systems.
Imaging Hardware
Secondary
Electron Detector: Cameca Standard
Backscattered
Electron Detector: Cameca TV rate,
variable-gain (fast) BSE
Cathodoluminescence
Detector: GATAN PanaCL/F
with removable RGB wavelength-band filters
Live-Time
Signal Acquisition: Cameca Digital Frame
Store system, providing signal averaging over acquisition times in the range of
200-10000 mS; two video channels providing simultaneous access to secondary
electrons, backscattered electrons, absorbed current, and x-ray intensity, with
output to two Sony PVM 14-N6U 15" monitors.
Image
Acquisition: Images for all signal
types (BSEI, SEI, CL, ABS, XR-EDXA, XR-WDS) are
acquired digitally with SAMx software that supports storage in a large variety
of file formats that includes 8 to 24-bit TIF, JPG, GIF, Bitmap, and WMF among
others. Image areas ≤ 1.6 x 1.6 mm
are acquired by beam-scanning, and the acquisition software permits multiple
sweeps/passes of the beam on each image, multiple reads of each pixel on each
sweep, and a user-selectable dwell time between pixels (useful for allowing
decay of emission between pixels for cathodoluminescence imaging). Larger area
imaging/mapping can be performed by scanning the stage under a fixed beam, or
by mosaic of smaller areas acquired by beam scanning.
Reflected and transmitted polarized light
microscopic image at fixed 400x magnification for sample viewing (only) through
Panasonic WV-CD132E CCD camera and Sony PVM 14-N6U monitor